An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics) (Paperback)

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics) By Sarah Fearn Cover Image

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics) (Paperback)

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The study of dark matter, in both astrophysics and particle physics, has emerged as one of the most active and exciting topics of research in recent years. This book reviews the history behind the discovery of missing mass (or unseen mass) in the Universe, and ties this into the proposed extensions to the Standard Model of Particle Physics (such as Supersymmetry), which were being proposed within the same time frame. This book is written as an introduction to these problems at the forefront of astrophysics and particle physics, with the goal of conveying the physics of dark matter to beginning undergraduate majors in scientific fields. The book goes onto describe existing and upcoming experiments and techniques, which will be used to detect dark matter either directly on indirectly.
Product Details ISBN: 9781681740249
ISBN-10: 1681740249
Publisher: Morgan & Claypool
Publication Date: October 16th, 2015
Pages: 66
Language: English
Series: Iop Concise Physics