Failure Analysis: High Technology Devices (Paperback)

Failure Analysis: High Technology Devices By Daniel J. D. Sullivan, Eric J. Carleton Cover Image

Failure Analysis: High Technology Devices (Paperback)


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The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

Dr. Daniel J. D. Sullivan attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, "Don't Date Crazy" by DJDS, and published a board game called Infection. Dr. Eric J. Carleton is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.
Product Details ISBN: 9781501524783
ISBN-10: 150152478X
Publisher: de Gruyter
Publication Date: October 24th, 2022
Pages: 128
Language: English